Electromigration in interconnets

Volkert, C. A.

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Electromigration in interconnets

Volkert, C. A. (2001). Electromigration in interconnets. In K. Buschow, R. Cahn, M. Flemings, B. Ilschner, E. Kramer, & S. Mahajan (Eds.), Encyclopedia of Materials: Science and Technology (pp. 2550-2557). Oxford, UK: Elsevier Science Ltd.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3653-9 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3654-7

Genre: Book Chapter

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37-ar_2001.pdf (Abstract), 45KB

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Creators:
Volkert, C. A.¹, Author

Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655

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Free keywords: MPI für Metallforschung; Abt. Arzt;

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Language(s): eng - English

Dates: Date issued: 2001

Publication Status: Issued

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Identifiers: eDoc: 25901

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Title: Encyclopedia of Materials: Science and Technology

Source Genre: Book

Creator(s):
Buschow, K.H.J., Editor
Cahn, R.W., Editor
Flemings, M.C., Editor
Ilschner, B., Editor
Kramer, E.J., Editor
Mahajan, S., Editor

Affiliations:
-

Publ. Info: Oxford, UK : Elsevier Science Ltd.

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 2550 - 2557 Identifier: -