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  Advances in energy-filtering transmission electron microscopy

Sigle, W., Zern, A., Hahn, K., Eigenthaler, U., & Rühle, M. (2001). Advances in energy-filtering transmission electron microscopy. Journal of Electron Microscopy, 50(6), 509-515.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3618-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3619-B
Genre: Journal Article
Alternative Title : J. Electron Microsc.

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 Creators:
Sigle, W.1, 2, Author           
Zern, A.1, Author           
Hahn, K.1, 2, Author           
Eigenthaler, U.1, 3, Author           
Rühle, M.1, Author           
Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
2Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              
3Scientific Staff Assembly Dual Beam, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497668              

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Free keywords: MPI für Metallforschung; Abt. Rühle; 27-ru_2002; energy-filtering transmission electron microscopy (EFTEM); bond mapping; amorphous materials; reduced density function; aberration correction; electron diffraction.
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Language(s): eng - English
 Dates: 2001
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 24342
ISI: 000173995200013
 Degree: -

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Title: Journal of Electron Microscopy
  Alternative Title : J. Electron Microsc.
Source Genre: Journal
 Creator(s):
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Publ. Info: -
Pages: - Volume / Issue: 50 (6) Sequence Number: - Start / End Page: 509 - 515 Identifier: ISSN: 0022-0744