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  Electron microscopy study of vertical cavity surface emitting lasers

Katcki, J., Ratajczak, J., Phillipp, F., Bugajski, M., & Muszalski, J. (2001). Electron microscopy study of vertical cavity surface emitting lasers. In A. Cullis (Ed.), Microscopy of Semiconducting Materials 2001. Proceedings of the Royal Microscopical Society Conference (pp. 493-496). Bristol: IOP Publishing Ltd.

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 Creators:
Katcki, J.1, Author
Ratajczak, J.1, Author
Phillipp, F.2, Author           
Bugajski, M.1, Author
Muszalski, J.1, Author
Affiliations:
1Inst Electr Mat Technol, Al Lotnikow 32-46, PL-02668 Warsaw,; Poland; Inst Electr Mat Technol, PL-02668 Warsaw, Poland;, ou_persistent22              
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497657              

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Free keywords: MPI für Intelligente Systeme; Ehem. Abt. Rühle;
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Language(s): eng - English
 Dates: 2001
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 24326
ISI: 000176465200106
 Degree: -

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Title: Microscopy of Semiconducting Materials
Place of Event: Oxford, UK
Start-/End Date: 2001-03-25 - 2001-03-29

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Title: Microscopy of Semiconducting Materials 2001. Proceedings of the Royal Microscopical Society Conference
Source Genre: Proceedings
 Creator(s):
Cullis, A.G., Editor
Affiliations:
-
Publ. Info: Bristol : IOP Publishing Ltd.
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 493 - 496 Identifier: -

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Title: Institute of Physics Conference Series
Source Genre: Series
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Publ. Info: -
Pages: - Volume / Issue: 169 Sequence Number: - Start / End Page: - Identifier: ISSN: 0951-3248