English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  A portable ultrahigh vacuum organic molecular beam deposition system for in situ x-ray diffraction measurements

Ritley, K. A., Krause, B., Schreiber, F., & Dosch, H. (2001). A portable ultrahigh vacuum organic molecular beam deposition system for in situ x-ray diffraction measurements. Review of Scientific Instruments, 72(2), 1453-1457.

Item is

Basic

show hide
Genre: Journal Article
Alternative Title : Rev. Sci. Instrum.

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Ritley, K. A.1, Author           
Krause, B.1, Author           
Schreiber, F.2, Author           
Dosch, H.1, 3, Author           
Affiliations:
1Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497645              
2Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644              
3Universität Stuttgart, Institut für Theoretische und Angewandte Physik, ou_persistent22              

Content

show
hide
Free keywords: MPI für Metallforschung; Abt. Dosch;
 Abstract: -

Details

show
hide
Language(s): eng - English
 Dates: 2001-02
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 21800
ISI: 000166688500036
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Review of Scientific Instruments
  Alternative Title : Rev. Sci. Instrum.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 72 (2) Sequence Number: - Start / End Page: 1453 - 1457 Identifier: ISSN: 0034-6748