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  Subsurface nanoindentation deformation of Cu-Al multilayers mapped in 3D by focused ion beam microscopy

Inkson, B. J., Steer, T., Möbus, G., & Wagner, T. (2001). Subsurface nanoindentation deformation of Cu-Al multilayers mapped in 3D by focused ion beam microscopy. Journal of Microscopy, 201, 256-269.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3573-9 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3574-7
Genre: Journal Article
Alternative Title : J. Microsc.

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18-ar_2001.pdf (Abstract), 60KB
 
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 Creators:
Inkson, B. J.1, Author
Steer, T.1, Author
Möbus, G.1, Author
Wagner, T.2, Author           
Affiliations:
1Univ Oxford, Dept Mat, Parks Rd, Oxford OX1 3PH, England; Univ Oxford, Dept Mat, Oxford OX1 3PH, England;, ou_persistent22              
2Central Scientific Facility Thin Film Laboratory, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497640              

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Free keywords: MPI für Metallforschung; Ehemalige Abt. Rühle; Abt. Arzt; ZWE Dünnschichtlabor; 3D; deformation mapping; focused ion beam microscopy; FIB; nanoindentation; multilayers
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Language(s): eng - English
 Dates: 2001-02
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 21785
ISI: 000167686400017
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Title: Journal of Microscopy
  Alternative Title : J. Microsc.
Source Genre: Journal
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Pages: - Volume / Issue: 201 Sequence Number: - Start / End Page: 256 - 269 Identifier: ISSN: 0022-2720