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  Diffraction analysis of internal strain-stress fields in textured, transversely isotropic thin films: theoretical basis and simulation

Leoni, M., Welzel, U., Lamparter, P., Mittemeijer, E. J., & Kamminga, J. D. (2001). Diffraction analysis of internal strain-stress fields in textured, transversely isotropic thin films: theoretical basis and simulation. Philosophical Magazine A-Physics of Condensed Matter Structure Defects and Mechanical Properties, 81(3), 597-623.

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Genre: Journal Article
Alternative Title : Philos. Mag. A-Phys. Condens. Matter Struct. Defect Mech. Prop.

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 Creators:
Leoni, M.1, Author
Welzel, U.2, Author           
Lamparter, P.2, Author           
Mittemeijer, E. J.2, 3, Author           
Kamminga, J. D.1, Author
Affiliations:
1Delft Univ Technol, Mat Sci Lab, NL-2628 AL Delft, Netherlands, ou_persistent22              
2Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644              
3Universität Stuttgart, Institut für Materialwissenschaft, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer;
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Language(s): eng - English
 Dates: 2001-03
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 21766
ISI: 000167679400004
 Degree: -

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Title: Philosophical Magazine A-Physics of Condensed Matter Structure Defects and Mechanical Properties
  Alternative Title : Philos. Mag. A-Phys. Condens. Matter Struct. Defect Mech. Prop.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 81 (3) Sequence Number: - Start / End Page: 597 - 623 Identifier: ISSN: 0141-8610