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  Alloying effects on electromigration mass transport

Dekker, J. P., Volkert, C. A., Arzt, E., & Gumbsch, P. (2001). Alloying effects on electromigration mass transport. Physical Review Letters, 87(3): 035901.

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Genre: Journal Article
Alternative Title : Phys. Rev. Lett.

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11-ar_2001.pdf (Abstract), 57KB
 
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 Creators:
Dekker, J. P., Author
Volkert, C. A.1, Author           
Arzt, E.1, 2, Author           
Gumbsch, P.1, Author           
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
2Universität Stuttgart, Institut für Metallkunde, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Arzt;
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Language(s): eng - English
 Dates: 2001-07-16
 Publication Status: Issued
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 21051
ISI: 000169989600030
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Title: Physical Review Letters
  Alternative Title : Phys. Rev. Lett.
Source Genre: Journal
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Pages: - Volume / Issue: 87 (3) Sequence Number: 035901 Start / End Page: - Identifier: ISSN: 0031-9007