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  Fatigue in thin films: lifetime and damage formation

Kraft, O., Schwaiger, R., & Wellner, P. (2001). Fatigue in thin films: lifetime and damage formation. Materials Science and Engineering A, 319(Sp. Iss. SI), 919-923.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-33B8-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-33B9-0
Genre: Journal Article
Alternative Title : Mater. Sci. Eng. A

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22-ar_2001.pdf (Abstract), 58KB
 
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 Creators:
Kraft, O.1, Author           
Schwaiger, R.1, Author           
Wellner, P.1, Author           
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              

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Free keywords: MPI für Metallforschung; Abt. Arzt; polyimide; fatigue; thin films; Cu; Ag
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Language(s): eng - English
 Dates: 2001-12
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 20404
ISI: 000173211200187
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Title: Materials Science and Engineering A
  Alternative Title : Mater. Sci. Eng. A
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 319 (Sp. Iss. SI) Sequence Number: - Start / End Page: 919 - 923 Identifier: ISSN: 0921-5093