English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
 
 
DownloadE-Mail
  Interconnect Failure due to Cyclic Loading

Keller, R. R., Mönig, R., Volkert, C. A., Arzt, E., Schwaiger, R., & Kraft, O. (2002). Interconnect Failure due to Cyclic Loading. In S. Baker, M. Korhonen, E. Arzt, & P. Ho (Eds.), Stress Induced Phenomena in Metallization: Proceedings of the Sixth International Workshop on Stress Induced Phenomena in Metallization (pp. 119-132). Melville, N.Y.: AIP.

Item is

Files

show Files
hide Files
:
10-ar_2002.pdf (Abstract), 55KB
 
File Permalink:
-
Name:
10-ar_2002.pdf
Description:
-
OA-Status:
Visibility:
Restricted (Max Planck Institute for Intelligent Systems, MSMT; )
MIME-Type / Checksum:
application/pdf
Technical Metadata:
Copyright Date:
-
Copyright Info:
eDoc_access: INSTITUT
License:
-

Locators

show

Creators

show
hide
 Creators:
Keller, R. R., Author
Mönig, R.1, Author           
Volkert, C. A.1, Author           
Arzt, E.1, 2, Author           
Schwaiger, R.1, Author           
Kraft, O.1, Author           
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
2Universität Stuttgart, Institut für Metallkunde, ou_persistent22              

Content

show
hide
Free keywords: MPI für Metallforschung; Abt. Arzt; 10-ar_2002;
 Abstract: -

Details

show
hide
Language(s): eng - English
 Dates: 2002
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 12187
 Degree: -

Event

show
hide
Title: 6th International Workshop on Stress Induced Phenomena in Metallization
Place of Event: Ithaca, New York [USA]
Start-/End Date: 2001-07-25 - 2001-07-27

Legal Case

show

Project information

show

Source 1

show
hide
Title: Stress Induced Phenomena in Metallization: Proceedings of the Sixth International Workshop on Stress Induced Phenomena in Metallization
Source Genre: Proceedings
 Creator(s):
Baker, S.P., Editor
Korhonen, M.A., Editor
Arzt, E.1, 2, Editor           
Ho, P.S., Editor
Affiliations:
1 Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655            
2 Universität Stuttgart, Institut für Metallkunde, ou_persistent22            
Publ. Info: Melville, N.Y. : AIP
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 119 - 132 Identifier: -

Source 2

show
hide
Title: American Institute of Physics Conference Proceedings
Source Genre: Series
 Creator(s):
American Institute of Physics, Editor  
Affiliations:
-
Publ. Info: -
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: - Identifier: -