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  New Type of Dislocation Mechanism in Ultrathin Copper Films

Balk, T. J., Dehm, G., & Arzt, E. (2002). New Type of Dislocation Mechanism in Ultrathin Copper Films. In C. Ozkan, R. Cammarata, L. Freund, & H. Gao (Eds.), Thin Films: Stresses and Mechanical Properties IX (pp. L2.7.1-L2.7.6).

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01-ar_2002.pdf (Abstract), 52KB
 
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 Creators:
Balk, T. J.1, Author           
Dehm, G.1, Author           
Arzt, E.1, 2, Author           
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
2Universität Stuttgart, Institut für Metallkunde, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Arzt; 01-ar_2002;
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Language(s): eng - English
 Dates: 2002
 Publication Status: Issued
 Pages: -
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 Rev. Type: -
 Identifiers: eDoc: 12135
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Title: Thin Films: Stresses and Mechanical Properties IX. Symposium at the 2001 MRS Fall Meeting
Place of Event: Boston, Mass.
Start-/End Date: 2001-11-26 - 2001-11-30

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Title: Thin Films: Stresses and Mechanical Properties IX
Source Genre: Proceedings
 Creator(s):
Ozkan, C.S., Editor
Cammarata, R.C., Editor
Freund, L.B.., Editor
Gao, H.1, Editor           
Affiliations:
1 Former Dept. Theory of Mesoscopic Phenomena, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497656            
Publ. Info: -
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: L2.7.1 - L2.7.6 Identifier: -

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Title: Materials Research Society Symposium Proceedings
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 Creator(s):
Materials Research Society, Editor  
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Pages: - Volume / Issue: - Sequence Number: - Start / End Page: - Identifier: -