Layer and defect structures of Ba F2/CaF2 multilayers

Jin-Phillipp, N. Y.; Sata, N.; Maier, J.; Scheu, C.; Rühle, M.

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Layer and defect structures of Ba F₂/CaF₂ multilayers

Jin-Phillipp, N. Y., Sata, N., Maier, J., Scheu, C., & Rühle, M. (2002). Layer and defect structures of Ba F₂/CaF₂ multilayers.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-32A8-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-32A9-B

Genre: Conference Paper

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Creators:
Jin-Phillipp, N. Y.^{1, 2, 3}, Author
Sata, N., Author
Maier, J.⁴, Author
Scheu, C.¹, Author
Rühle, M.¹, Author

Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
2Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497645
3Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669
4Max Planck Society, ou_persistent13

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Free keywords: MPI für Metallforschung; Abt. Rühle; 51-ru_2002

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Language(s): eng - English

Dates: Date issued: 2002

Publication Status: Issued

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Rev. Type: -

Identifiers: eDoc: 10966

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Title: Microscopy and Microanalysis 2002

Place of Event: Québec City [Quebec, Canada]

Start-/End Date: 2002-08-05 - 2002-08-08

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Title: Proceedings Microscopy and Microanalysis 2002

Source Genre: Issue

Creator(s):
Voelkl, E., Editor
Piston, D., Editor
Gauvin, R., Editor
Lockley, A. J., Editor
Bailey, G. W., Editor
McKernan, S., Editor

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-

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Pages: CD-ROM Volume / Issue: - Sequence Number: - Start / End Page: 1164 - 1165 Identifier: -

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Title: Microscopy and Microanalysis

Source Genre: Journal

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Pages: CD-ROM Volume / Issue: 8 (Supplement 2) Sequence Number: - Start / End Page: - Identifier: -