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  Trenches around and between self-assembled silicon/germanium islands grown on silicon substrates investigated by atomic force microscopy

Denker, U., Daschiel, M., Jin-Phillipp, N. Y., & Schmidt, O. G. (2002). Trenches around and between self-assembled silicon/germanium islands grown on silicon substrates investigated by atomic force microscopy. Materials Science and Engineering B, 89, 166-170.

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 Creators:
Denker, U.1, Author
Daschiel, M., Author
Jin-Phillipp, N. Y.2, 3, 4, Author           
Schmidt, O. G., Author
Affiliations:
1Max Planck Society, ou_persistent13              
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
3Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497645              
4Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              

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Free keywords: MPI für Metallforschung; Abt. Rühle; 39-ru_2002
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Language(s): eng - English
 Dates: 2002
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 10821
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Title: Materials Science and Engineering B
Source Genre: Journal
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Pages: - Volume / Issue: 89 Sequence Number: - Start / End Page: 166 - 170 Identifier: -