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  Structural and chemical analysis of materials with high spatial resolution

van Benthem, K., Krämer, S., Sigle, W., & Rühle, M. (2002). Structural and chemical analysis of materials with high spatial resolution. Mikrochimica Acta, 138(3-4), 181-193.

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Genre: Journal Article
Alternative Title : Mikrochim. Acta

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2-ru_2002.pdf.pdf (Abstract), 7KB
 
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 Creators:
van Benthem, K.1, Author           
Krämer, S.1, Author           
Sigle, W.1, 2, Author           
Rühle, M.1, Author           
Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
2Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              

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Free keywords: MPI für Metallforschung; Abt. Rühle; 2-ru_2002; transmission electron microscopy; high-resolution transmission electron microscopy; electron energy-loss spectroscopy; electron energy-loss near-edge structure; convergent beam electron diffraction
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Language(s): eng - English
 Dates: 2002
 Publication Status: Issued
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 6843
ISI: 000175560100008
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Title: Mikrochimica Acta
  Alternative Title : Mikrochim. Acta
Source Genre: Journal
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Pages: - Volume / Issue: 138 (3-4) Sequence Number: - Start / End Page: 181 - 193 Identifier: ISSN: 0026-3672