Stress in thin films; Diffraction elastic constants and grain interaction

Welzel, U.; Leoni, M.; Lamparter, P.; Mittemeijer, E. J.

Local TagsRelease HistoryDetailsSummary

Stress in thin films; Diffraction elastic constants and grain interaction

Welzel, U., Leoni, M., Lamparter, P., & Mittemeijer, E. J. (2002). Stress in thin films; Diffraction elastic constants and grain interaction. Journal of Materials Science & Technology, 18(2), 121-124.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-31D6-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-31D7-B

Genre: Journal Article

Alternative Title : J. Mater. Sci. Technol.

Files

show Files

Locators

show

Creators

show

hide

Creators:
Welzel, U.¹, Author
Leoni, M., Author
Lamparter, P.¹, Author
Mittemeijer, E. J.^{1, 2}, Author

Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644
2Universität Stuttgart, Institut für Materialwissenschaft, ou_persistent22

Content

show

hide

Free keywords: MPI für Metallforschung; Abt. Mittemeijer; 6-mi_2002; thin film; elastic constant; grain interaction; X-ray diffraction

Abstract: -

Details

show

hide

Language(s): eng - English

Dates: Date issued: 2002-03

Publication Status: Issued

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: Peer

Identifiers: eDoc: 6890
ISI: 000174881400007

Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show

hide

Title: Journal of Materials Science & Technology

Alternative Title : J. Mater. Sci. Technol.

Source Genre: Journal

Creator(s):

Affiliations:

Publ. Info: -

Pages: - Volume / Issue: 18 (2) Sequence Number: - Start / End Page: 121 - 124 Identifier: ISSN: 1005-0302