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  Fatigue behavior of polycrystalline thin copper films

Kraft, O., Wellner, P., Hommel, M., Schwaiger, R., & Arzt, E. (2002). Fatigue behavior of polycrystalline thin copper films. Zeitschrift für Metallkunde, 93(5), 392-400.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3132-0 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3133-E
Genre: Journal Article
Alternative Title : Z. Metallk.

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14-ar_2002.pdf (Abstract), 60KB
 
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 Creators:
Kraft, O.1, Author           
Wellner, P.1, Author           
Hommel, M.1, Author           
Schwaiger, R.1, Author           
Arzt, E.1, 2, Author           
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
2Universität Stuttgart, Institut für Metallkunde, ou_persistent22              

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Free keywords: MPI für Intelligente Systeme; Ehemalige Abt. Arzt; 14-ar_2002; fatigue; thin films; size effect
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Language(s): eng - English
 Dates: 2002-05
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 6779
ISI: 000176310600008
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Title: Zeitschrift für Metallkunde
  Alternative Title : Z. Metallk.
Source Genre: Journal
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Pages: - Volume / Issue: 93 (5) Sequence Number: - Start / End Page: 392 - 400 Identifier: ISSN: 0044-3093