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  Dislocation dynamics in sub-micron confinement: recent progress in Cu thin film plasticity

Dehm, G., Balk, T. J., von Blanckenhagen, B., Gumbsch, P., & Arzt, E. (2002). Dislocation dynamics in sub-micron confinement: recent progress in Cu thin film plasticity. Zeitschrift für Metallkunde, 93(5), 383-391.

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Genre: Journal Article
Alternative Title : Z. Metallk.

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06-ar_2002.pdf (Abstract), 61KB
 
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 Creators:
Dehm, G.1, Author           
Balk, T. J.1, Author           
von Blanckenhagen, B.1, Author           
Gumbsch, P.1, Author           
Arzt, E.1, 2, Author           
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
2Universität Stuttgart, Institut für Metallkunde, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Arzt; 06-ar_2002; thin film plasticity; discrete dislocation dynamics; constrained diffusional creep; in situ TEM; thermal stress
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Language(s): eng - English
 Dates: 2002-05
 Publication Status: Issued
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 Rev. Type: Peer
 Identifiers: eDoc: 6778
ISI: 000176310600007
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Title: Zeitschrift für Metallkunde
  Alternative Title : Z. Metallk.
Source Genre: Journal
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Pages: - Volume / Issue: 93 (5) Sequence Number: - Start / End Page: 383 - 391 Identifier: ISSN: 0044-3093