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  Schädigungsverhalten von Kupfer-Leiterbahnen unter Wechselstrombelastung

Orso, S. (2002). Schädigungsverhalten von Kupfer-Leiterbahnen unter Wechselstrombelastung. Diploma Thesis, Universität Stuttgart, Stuttgart.

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 Creators:
Orso, S.1, Author           
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              

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Free keywords: MPI für Intelligente Systeme; Ehemalige Abt. Arzt; Dipl-01-ar_2002;
 Abstract: -

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Language(s): eng - English
 Dates: 2002-06
 Publication Status: Accepted / In Press
 Pages: 79 p.
 Publishing info: Stuttgart : Universität Stuttgart
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 12566
 Degree: Diploma

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