Microstructural evolution in passivated Al films on Si substrates during 
thermal cycling

Legros, M.; Hemker, K. J.; Gouldstone, A.; Suresh, S.; Keller-Flaig, R.-M.; Arzt, E.

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Microstructural evolution in passivated Al films on Si substrates during thermal cycling

Legros, M., Hemker, K. J., Gouldstone, A., Suresh, S., Keller-Flaig, R.-M., & Arzt, E. (2002). Microstructural evolution in passivated Al films on Si substrates during thermal cycling. Acta Materialia, 50(13), 3435-3452.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-303A-8 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-303B-6

Genre: Journal Article

Alternative Title : Acta Mater.

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Creators:
Legros, M.¹, Author
Hemker, K. J.¹, Author
Gouldstone, A.¹, Author
Suresh, S.¹, Author
Keller-Flaig, R.-M.², Author
Arzt, E.^{2, 3}, Author

Affiliations:
1Ecole Mines, CNRS, Lab Phys Mat, Parc Saurupt, F-54042 Nancy,; France; Johns Hopkins Univ, Dept Mech Engn, Baltimore, MD 21218 USA; MIT, Dept Mat Sci & Engn, Cambridge, MA 02139 USA;, ou_persistent22
2Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655
3Universität Stuttgart, Institut für Metallkunde, ou_persistent22

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Free keywords: MPI für Metallforschung; Abt. Arzt; in situ TEM; thin films; Al; plastic deformation; dislocations

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Language(s): eng - English

Dates: Date issued: 2002-08-01

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 6732
ISI: 000177559400012

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Title: Acta Materialia

Alternative Title : Acta Mater.

Source Genre: Journal

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Pages: - Volume / Issue: 50 (13) Sequence Number: - Start / End Page: 3435 - 3452 Identifier: ISSN: 1359-6454