Transmission electron microscopy study of a new silicon nitride phase

Cai, Y.; Zimmermann, A.; Prinz, S.; Krämer, S.; Phillipp, F.; Sigle, W.; Aldinger, F.

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Transmission electron microscopy study of a new silicon nitride phase

Cai, Y., Zimmermann, A., Prinz, S., Krämer, S., Phillipp, F., Sigle, W., et al. (2002). Transmission electron microscopy study of a new silicon nitride phase. Philosophical Magazine Letters, 82(10), 553-558.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2FF7-5 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2FF9-1

Genre: Journal Article

Alternative Title : Philos. Mag. Lett.

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Creators:
Cai, Y.¹, Author
Zimmermann, A.¹, Author
Prinz, S.¹, Author
Krämer, S.², Author
Phillipp, F.², Author
Sigle, W.², Author
Aldinger, F.^{1, 3}, Author

Affiliations:
1Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497654
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
3Universität Stuttgart, Institut für Nichtmetallische Anorganische Materialien, ou_persistent22

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Free keywords: MPI für Metallforschung; Abt. Aldinger; Abt. Rühle; ZWE Hochspannungs-Mikroskopie;

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Language(s): eng - English

Dates: Date issued: 2002-10

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 121067
ISI: 000178881000004

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Title: Philosophical Magazine Letters

Alternative Title : Philos. Mag. Lett.

Source Genre: Journal

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Pages: - Volume / Issue: 82 (10) Sequence Number: - Start / End Page: 553 - 558 Identifier: ISSN: 0950-0839