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  Investigation of self-assembled InP-GaInP quantum dot stacks by transmission electron microscopy

Fantini, A., Phillipp, F., Kohler, C., Porsche, J., & Scholz, F. (2002). Investigation of self-assembled InP-GaInP quantum dot stacks by transmission electron microscopy. Journal of Crystal Growth, 244(2), 129-135.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2FEF-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2FF1-2
Genre: Journal Article
Alternative Title : J. Cryst. Growth

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 Creators:
Fantini, A.1, Author
Phillipp, F.2, Author           
Kohler, C.2, Author           
Porsche, J.1, Author
Scholz, F.1, Author
Affiliations:
1Univ Stuttgart, Inst Phys 4, Pfaffenwaldring 57, D-70550; Stuttgart, Germany; Univ Stuttgart, Inst Theoret & Angew Phys, D-70550 Stuttgart, Germany, ou_persistent22              
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              

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Free keywords: MPI für Intelligente Systeme; Ehem. Abt. Rühle; 42-ru_2002; antiphase boundaries; quantum islands; strain; transmission electron microscopy (TEM); metalorganic vapor phase epitaxy (MOVPE); InP
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Language(s): eng - English
 Dates: 2002-10
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 6701
ISI: 000178208300001
 Degree: -

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Title: Journal of Crystal Growth
  Alternative Title : J. Cryst. Growth
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 244 (2) Sequence Number: - Start / End Page: 129 - 135 Identifier: ISSN: 0022-0248