Progress in the preparation of cross-sectional TEM specimens by ion-beam 
thinning

Strecker, A.; Bäder, U.; Kelsch, M.; Salzberger, U.; Sycha, M.; Gao, M.; Richter, G.; van Benthem, K.

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Progress in the preparation of cross-sectional TEM specimens by ion-beam thinning

Strecker, A., Bäder, U., Kelsch, M., Salzberger, U., Sycha, M., Gao, M., et al. (2003). Progress in the preparation of cross-sectional TEM specimens by ion-beam thinning. Zeitschrift für Metallkunde, 94, 290-297.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2F39-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2F3B-B

Genre: Journal Article

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Creators:
Strecker, A.¹, Author
Bäder, U.¹, Author
Kelsch, M.¹, Author
Salzberger, U.¹, Author
Sycha, M.¹, Author
Gao, M.¹, Author
Richter, G.^{1, 2}, Author
van Benthem, K.¹, Author

Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
2Central Scientific Facility Thin Film Laboratory, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497640

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Free keywords: MPI für Metallforschung; Abt. Rühle; ZWE Hochspannungs-Mikroskopie;

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Language(s): eng - English

Dates: Date issued: 2003

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 200435

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Title: Zeitschrift für Metallkunde

Source Genre: Journal

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Pages: - Volume / Issue: 94 Sequence Number: - Start / End Page: 290 - 297 Identifier: -