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  Creep behavior and microstructural changes during short-term creep in a gamma-TiAl based alloy with fully lamellar microstructure

Chatterjee, A., Clemens, H., Dehm, G., Mecking, H., & Arzt, E. (2003). Creep behavior and microstructural changes during short-term creep in a gamma-TiAl based alloy with fully lamellar microstructure. In Y. W. Kim, & H. R. Clemens A. H. (Eds.), Gamma Titanium Aluminides 2003 (pp. 425-430). Warrendale, PA: TMS.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2F2F-7 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2F30-1
Genre: Conference Paper

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 Creators:
Chatterjee, A.1, Author           
Clemens, H.1, Author           
Dehm, G.1, Author           
Mecking, H.2, Author
Arzt, E.1, 3, Author           
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
2Montanuniversität Leoben, Austria; Institut für Werkstoffphysik und -technologie, TU Hamburg-Haarburg, ou_persistent22              
3Universität Stuttgart, Institut für Metallkunde, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Arzt;
 Abstract: -

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Language(s): eng - English
 Dates: 2003
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 175340
 Degree: -

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Title: Gamma Titanium Aluminides 2003
Place of Event: San Diego, Calif.
Start-/End Date: 2003-03-02 - 2003-03-06

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Title: Gamma Titanium Aluminides 2003
Source Genre: Proceedings
 Creator(s):
Kim, Y. W., Editor
Clemens A. H., H. Rosenberger, Editor
Affiliations:
-
Publ. Info: Warrendale, PA : TMS
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 425 - 430 Identifier: -