English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Creep of γ(TiAl) sheet material with a high niobium content

Bystrzanowski, S., Bartels, A., Clemens, H., Gerling, R., Schimansky, F. P., Kestler, H., et al. (2003). Creep of γ(TiAl) sheet material with a high niobium content. In Y.-W. Kim, H. Clemens, & A. Rosenberger (Eds.), Gamma Titanium Aluminides 2003 (pp. 431-436). Warrendale, PA: TMS.

Item is

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Bystrzanowski, S.1, Author
Bartels, A.1, Author
Clemens, H.2, Author           
Gerling, R.1, Author
Schimansky, F. P.1, Author
Kestler, H.1, Author
Dehm, G.2, Author           
Haneczok, G.1, Author
Weller, M.2, Author           
Affiliations:
1TU Hamburg-Harburg; University of Leoben, Leoben, Austria; Institut für Werkstoffforschung, GKSS, Geesthacht; Plansee AG, reutte, Austria; Silesian University, Katowice, Poland, ou_persistent22              
2Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              

Content

show
hide
Free keywords: MPI für Metallforschung; Abt. Arzt;
 Abstract: -

Details

show
hide
Language(s): eng - English
 Dates: 2003
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 112751
 Degree: -

Event

show
hide
Title: Gamma Titanium Aluminides 2003
Place of Event: San Diego, Calif.
Start-/End Date: 2003-03-02 - 2003-03-06

Legal Case

show

Project information

show

Source 1

show
hide
Title: Gamma Titanium Aluminides 2003
Source Genre: Proceedings
 Creator(s):
Kim, Y.-W., Editor
Clemens, H.1, Editor           
Rosenberger, A.H., Editor
Affiliations:
1 Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655            
Publ. Info: Warrendale, PA : TMS
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 431 - 436 Identifier: -