Mechanical size-effects and dislocation dynamics in Cu thin films

Dehm, G.; Edongue, H.; Balk, T. J.; Arzt, E.

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Mechanical size-effects and dislocation dynamics in Cu thin films

Dehm, G., Edongue, H., Balk, T. J., & Arzt, E. (2003). Mechanical size-effects and dislocation dynamics in Cu thin films. Microscopy and Microanalysis, (Suppl. 3), 246-247.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2E1F-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2E20-9

Genre: Conference Paper

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Creators:
Dehm, G.¹, Author
Edongue, H.^{1, 2}, Author
Balk, T. J.¹, Author
Arzt, E.^{1, 3}, Author

Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
3Universität Stuttgart, Institut für Metallkunde, ou_persistent22

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Free keywords: MPI für Metallforschung; Abt. Arzt;

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Language(s): eng - English

Dates: Date issued: 2003

Publication Status: Issued

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Identifiers: eDoc: 56100

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Title: Microscopy Conference 2003 (MC 2003). Deutsche Gesellschaft für Elektronenmikroskopie, 31st Conference

Place of Event: Dresden, Germany

Start-/End Date: 2003-09-07 - 2003-09-12

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Title: Microscopy and Microanalysis

Source Genre: Journal

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Publ. Info: New York, NY : Cambridge Univ. Pr.

Pages: - Volume / Issue: (Suppl. 3) Sequence Number: - Start / End Page: 246 - 247 Identifier: -

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Title: Microscopy Conference 2003

Source Genre: Proceedings

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Publ. Info: New York, NY : Cambridge Univ. Pr.

Pages: - Volume / Issue: (Suppl. 3) Sequence Number: - Start / End Page: 246 - 247 Identifier: -