Abnormal grain growth in alumina: synergistic and the effects of yttria and 
silica

MacLaren, I.; Cannon, R. M.; Gülgün, M. A.; Voytovych, R.; Popescu-Pogrion, N.; Scheu, C.; Täffner, U.; Rühle, M.

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Abnormal grain growth in alumina: synergistic and the effects of yttria and silica

MacLaren, I., Cannon, R. M., Gülgün, M. A., Voytovych, R., Popescu-Pogrion, N., Scheu, C., et al. (2003). Abnormal grain growth in alumina: synergistic and the effects of yttria and silica. Journal of the American Ceramic Society, 86(4), 650-659.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2DE1-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2DE2-0

Genre: Journal Article

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Creators:
MacLaren, I.¹, Author
Cannon, R. M.², Author
Gülgün, M. A.², Author
Voytovych, R.², Author
Popescu-Pogrion, N.³, Author
Scheu, C.², Author
Täffner, U.^{4, 5, 6}, Author
Rühle, M.², Author

Affiliations:
1Technische Universität Darmstadt, FB Material- und Geowissenschaften, 64287 Darmstadt, Germany Evans Hall (MC 1760), Lawrence Berkeley National Laboratory, Berkeley, California 94720 Sabanci University, FENS, Tuzla, Instanbul 81474, Turkey, ou_persistent22
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
3Max Planck Society, ou_persistent13
4Former Central Scientific Facility Metallography, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497652
5Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669
6Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497654

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Free keywords: MPI für Intelligente Systeme; Ehem. Abt. Rühle;

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Language(s): eng - English

Dates: Date issued: 2003

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 51273

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Title: Journal of the American Ceramic Society

Source Genre: Journal

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Pages: - Volume / Issue: 86 (4) Sequence Number: - Start / End Page: 650 - 659 Identifier: -