Optimized preparation of cross-sectional TEM specimens of organic thin films

Dürr, A. C.; Schreiber, F.; Kelsch, M.; Dosch, H.

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Optimized preparation of cross-sectional TEM specimens of organic thin films

Dürr, A. C., Schreiber, F., Kelsch, M., & Dosch, H. (2003). Optimized preparation of cross-sectional TEM specimens of organic thin films. Ultramicroscopy, 98(1), 51-55.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2DD0-7 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2DD1-5

Genre: Journal Article

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Creators:
Dürr, A. C.¹, Author
Schreiber, F.², Author
Kelsch, M.^{3, 4}, Author
Dosch, H.^{1, 5}, Author

Affiliations:
1Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497645
2Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644
3Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
4Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669
5Universität Stuttgart, Institut für Theoretische und Angewandte Physik, ou_persistent22

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Free keywords: MPI für Metallforschung; Abt. Dosch; Abt. Rühle; ZWE Hochspannungs-Mikroskopie;

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Language(s): eng - English

Dates: Date issued: 2003

Publication Status: Issued

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Identifiers: eDoc: 51190

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Title: Ultramicroscopy

Source Genre: Journal

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Pages: - Volume / Issue: 98 (1) Sequence Number: - Start / End Page: 51 - 55 Identifier: -