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  Transmission electron microscopy of In(Ga)As quantum dot structures

Katcki, J., Ratajczak, J., Laszcz, A., Phillipp, F., Paranthoen, C., Cheng, X. L., et al. (2003). Transmission electron microscopy of In(Ga)As quantum dot structures. 4, 1-6.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2D9E-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2DA0-2
Genre: Journal Article

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 Creators:
Katcki, J.1, Author
Ratajczak, J.1, Author
Laszcz, A.1, Author
Phillipp, F.2, Author           
Paranthoen, C.1, Author
Cheng, X. L.1, Author
Fiore, A.1, Author
Passaseo, A.1, Author
Cingolani, R.1, Author
Affiliations:
1Institute of Electron Technology, Warsaw, Poland;Institut de Micro-Optoélectronique, Ecole Polytechnique, Lausanne, Switzerland; National Nanotechnology Laboratory – INFM, Università di Lecce, Lecce, Italy, ou_persistent22              
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497657              

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Free keywords: MPI für Metallforschung; Abt. Rühle; ZWE Hochspannungs-Mikroskopie;
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Language(s): eng - English
 Dates: 2003
 Publication Status: Issued
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 Rev. Type: Peer
 Identifiers: eDoc: 49870
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Title: 4
Source Genre: Issue
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Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 1 - 6 Identifier: -

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Title: Electron Technology Internet Journal
Source Genre: Journal
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Pages: - Volume / Issue: 35 Sequence Number: - Start / End Page: - Identifier: -