Electron microscopy study of advanced heterostructures for optoelectronics

Katcki, J.; Ratajczak, J.; Phillipp, F.; Muszalski, J.; Bugajski, M.; Chen, J. X.; Fiore, A.

Local TagsRelease HistoryDetailsSummary

Electron microscopy study of advanced heterostructures for optoelectronics

Katcki, J., Ratajczak, J., Phillipp, F., Muszalski, J., Bugajski, M., Chen, J. X., et al. (2003). Electron microscopy study of advanced heterostructures for optoelectronics. Materials Chemistry and Physics, 81(2-3), 244-248.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2D8A-5 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2D8D-0

Genre: Journal Article

Files

show Files

Locators

show

Creators

show

hide

Creators:
Katcki, J.¹, Author
Ratajczak, J.¹, Author
Phillipp, F.², Author
Muszalski, J.¹, Author
Bugajski, M.¹, Author
Chen, J. X.¹, Author
Fiore, A.¹, Author

Affiliations:
1Institute of Electron Technology, Warsaw, PolandInstitut de Micro-Optoelectronique, Ecole Polytechnique, Lausanne, Switzerland, ou_persistent22
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497657

Content

show

hide

Free keywords: MPI für Metallforschung; Abt. Rühle; ZWE Hochspannungs-Mikroskopie;

Abstract: -

Details

show

hide

Language(s): eng - English

Dates: Date issued: 2003

Publication Status: Issued

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: Peer

Identifiers: eDoc: 48890

Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show

hide

Title: Materials Chemistry and Physics

Source Genre: Journal

Creator(s):

Affiliations:

Publ. Info: -

Pages: - Volume / Issue: 81 (2-3) Sequence Number: - Start / End Page: 244 - 248 Identifier: -