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  Preparation of hard-to-make TEM samples using the FIB microscope

Volkert, C. A., Heiland, B., & Kauffmann, F. (2003). Preparation of hard-to-make TEM samples using the FIB microscope. Praktische Metallographie-Practical Metallography, 40(4), 193-208.

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Genre: Journal Article
Alternative Title : Prakt. Metallogr.-Pract. Metallogr.

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 Creators:
Volkert, C. A.1, Author           
Heiland, B.1, Author           
Kauffmann, F.1, Author           
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              

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Free keywords: MPI für Metallforschung; Abt. Arzt;
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Language(s): eng - English
 Dates: 2003-04
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 112769
ISI: 000183440400005
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Title: Praktische Metallographie-Practical Metallography
  Alternative Title : Prakt. Metallogr.-Pract. Metallogr.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 40 (4) Sequence Number: - Start / End Page: 193 - 208 Identifier: ISSN: 0032-678X