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  Grain size dependent grain boundary defect structure: case of doped zirconia

Guo, X., & Zhang, Z. L. (2003). Grain size dependent grain boundary defect structure: case of doped zirconia. Acta Materialia, 51(9), 2539-2547.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0010-2CA3-4 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0010-2CA4-2
Genre: Journal Article
Alternative Title : Acta Mater.

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 Creators:
Guo, X.1, Author              
Zhang, Z. L.2, Author              
Affiliations:
1Former Dept. Theory of Mesoscopic Phenomena, Max Planck Institute for Intelligent Systems, Max Planck Society, escidoc:1497656              
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, escidoc:1497657              

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Free keywords: MPI für Metallforschung; Abt. Rühle; zirconium oxide, grain boundaries, electrical conductivity, high resolution electron microscopy (HREM), oxygen vacancy
 Abstract: -

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Language(s): eng - English
 Dates: 2003-05-23
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 112069
ISI: 000182928900009
 Degree: -

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Title: Acta Materialia
  Alternative Title : Acta Mater.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 51 (9) Sequence Number: - Start / End Page: 2539 - 2547 Identifier: ISSN: 1359-6454