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  Electrical and structural characterization of a low-angle tilt grain boundary in iron-doped strontium titanate

De Souza, R. A., Fleig, J., Maier, J., Kienzle, O., Zhang, Z. L., Sigle, W., et al. (2003). Electrical and structural characterization of a low-angle tilt grain boundary in iron-doped strontium titanate. Journal of the American Ceramic Society, 86(6), 922-928.

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Genre: Journal Article
Alternative Title : J. Am. Ceram. Soc.

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 Creators:
De Souza, R. A.1, Author
Fleig, J.1, Author
Maier, J.1, Author
Kienzle, O.2, Author           
Zhang, Z. L.2, Author           
Sigle, W.2, 3, Author           
Rühle, M.2, Author           
Affiliations:
1Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany., ou_persistent22              
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
3Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              

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Free keywords: MPI für Metallforschung; Abt. Rühle;
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Language(s): eng - English
 Dates: 2003-06
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 112031
ISI: 000183499200008
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Title: Journal of the American Ceramic Society
  Alternative Title : J. Am. Ceram. Soc.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 86 (6) Sequence Number: - Start / End Page: 922 - 928 Identifier: ISSN: 0002-7820