Direct atom-resolved imaging of oxides and their grain boundaries

Zhang, Z. L.; Sigle, W.; Phillipp, F.; Rühle, M.

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Direct atom-resolved imaging of oxides and their grain boundaries

Zhang, Z. L., Sigle, W., Phillipp, F., & Rühle, M. (2003). Direct atom-resolved imaging of oxides and their grain boundaries. Science, 302, 846-849.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2C25-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2C28-B

Genre: Journal Article

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Creators:
Zhang, Z. L.¹, Author
Sigle, W.^{1, 2}, Author
Phillipp, F.¹, Author
Rühle, M.¹, Author

Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
2Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669

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Free keywords: MPI für Metallforschung; Abt. Rühle;

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Language(s): eng - English

Dates: Date issued: 2003-10-31

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 51048

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Title: Science

Source Genre: Journal

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Pages: - Volume / Issue: 302 Sequence Number: - Start / End Page: 846 - 849 Identifier: -