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  Electromigration-induced plastic deformation in passivated metal lines

Valek, B. C., Bravman, J. C., Tamura, N., MacDowell, A. A., Celestre, R. S., Padmore, H. A., et al. (2003). Electromigration-induced plastic deformation in passivated metal lines. Applied Physics Letters, 81(22), 4168-4170.

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 Creators:
Valek, B. C., Author
Bravman, J. C., Author
Tamura, N., Author
MacDowell, A. A., Author
Celestre, R. S., Author
Padmore, H. A., Author
Spolenak, R.1, Author           
Brown, W. L., Author
Batterman, B. W., Author
Patel, J. R., Author
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              

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Free keywords: MPI für Metallforschung; Abt. Arzt;
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Language(s): eng - English
 Dates: 2003-11-25
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 55941
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Title: Applied Physics Letters
Source Genre: Journal
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Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 81 (22) Sequence Number: - Start / End Page: 4168 - 4170 Identifier: -