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  Quantitative Analysis of Angle-Resolved XPS Spectra Recorded in Parallel Data Acquisition Mode

Vinodh, M., & Jeurgens, L. (2004). Quantitative Analysis of Angle-Resolved XPS Spectra Recorded in Parallel Data Acquisition Mode. Surface and Interface Analysis, 36, 1629-1636.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2BD4-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2BD5-B
Genre: Journal Article

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394.pdf (Abstract), 12KB
 
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 Creators:
Vinodh, M.S.1, Author           
Jeurgens, L.P.H.1, Author           
Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644              

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer;
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Language(s): eng - English
 Dates: 2004
 Publication Status: Issued
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 Identifiers: eDoc: 238121
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Title: Surface and Interface Analysis
Source Genre: Journal
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Pages: - Volume / Issue: 36 Sequence Number: - Start / End Page: 1629 - 1636 Identifier: -