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  Channel cracking of NiAl thin films on Si substrates

Wellner, P., Kraft, O., Dehm, G., Anderson, J., & Arzt, E. (2004). Channel cracking of NiAl thin films on Si substrates. Acta Materialia, 52, 2325-2336.

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 Creators:
Wellner, P.1, Author           
Kraft, O.1, Author           
Dehm, G.1, Author           
Anderson, J.2, Author
Arzt, E.1, 3, Author           
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
2Institut für Materialforschung II,Forschungszentrum Karlsruhe und Institut für Zuverlässigkeit von Bauteilen und Systemen der Universität Karlsruhe, Germany Institute of Polymer Mechanics, Riga, Latvia, ou_persistent22              
3Universität Stuttgart, Institut für Metallkunde, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Arzt;
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Language(s): eng - English
 Dates: 2004
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 175371
 Degree: -

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Title: Acta Materialia
Source Genre: Journal
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Pages: - Volume / Issue: 52 Sequence Number: - Start / End Page: 2325 - 2336 Identifier: -