Atomic-scale imaging of asymmetric Lomer dislocation cores at the Si/Ge (001) 
heterointerface

Stirman, J. N.; Crozier, P. A.; Smith, D. J.; Phillipp, F.; Brill, G.; Sivananthan, S.

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Atomic-scale imaging of asymmetric Lomer dislocation cores at the Si/Ge (001) heterointerface

Stirman, J. N., Crozier, P. A., Smith, D. J., Phillipp, F., Brill, G., & Sivananthan, S. (2004). Atomic-scale imaging of asymmetric Lomer dislocation cores at the Si/Ge (001) heterointerface. Applied Physics Letters, 84, 2530-2532.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2A58-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2A5A-B

Genre: Journal Article

Alternative Title : Appl. Phys. Lett.

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Creators:
Stirman, J. N.¹, Author
Crozier, P. A.¹, Author
Smith, D. J.¹, Author
Phillipp, F.², Author
Brill, G.¹, Author
Sivananthan, S.¹, Author

Affiliations:
1Center for Solid State Science, Arizone State University, Tempe, Arizone, USA;Microphysics Laboratory, Department of Physics, University of Illinois at Chicago, Chicago, Illinois, USA, ou_persistent22
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497657

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Free keywords: MPI für Metallforschung; Abt. Rühle; ZWE Hochspannungs-Mikroskopie;

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Language(s): eng - English

Dates: Date issued: 2004

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 126418

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Title: Applied Physics Letters

Alternative Title : Appl. Phys. Lett.

Source Genre: Journal

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Pages: - Volume / Issue: 84 Sequence Number: - Start / End Page: 2530 - 2532 Identifier: -