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  Parameter Detection of Thin Films from their X-Ray Reflectivity by Support Vector Machines.

Strauß, D., Steidl, G., & Welzel, U. (2004). Parameter Detection of Thin Films from their X-Ray Reflectivity by Support Vector Machines. Applied Numerical Mathematics, 48, 223-236.

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Strauß, D.J., Author
Steidl, G., Author
Welzel, U.1, Author           
Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644              

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer;
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Language(s): eng - English
 Dates: 2004
 Publication Status: Issued
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 Identifiers: eDoc: 124095
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Title: Applied Numerical Mathematics
Source Genre: Journal
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Pages: - Volume / Issue: 48 Sequence Number: - Start / End Page: 223 - 236 Identifier: -