Variation of the electron inelastic mean free path during depth profiling of 
the Fe/Si interface as determined by quantitative REELS

Prieto, P.; Hofmann, S.; Elizalde, E.; Sanz, J. M.

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Variation of the electron inelastic mean free path during depth profiling of the Fe/Si interface as determined by quantitative REELS

Prieto, P., Hofmann, S., Elizalde, E., & Sanz, J. M. (2004). Variation of the electron inelastic mean free path during depth profiling of the Fe/Si interface as determined by quantitative REELS. Surface and Interface Analysis, 36(10), 1392-1401.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-28B6-B Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-28B7-9

Genre: Journal Article

Alternative Title : Surf. Interface Anal.

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Creators:
Prieto, P.¹, Author
Hofmann, S.², Author
Elizalde, E.¹, Author
Sanz, J. M.¹, Author

Affiliations:
1Univ Autonoma Madrid, Dept Fis Aplicada 112, E-28049 Madrid, Spain.; ., ou_persistent22
2Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644

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Free keywords: MPI für Metallforschung; Emeriti and Others; electron IMFP; depth profiling; Fe/Si interface; REELS

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Language(s): eng - English

Dates: Date issued: 2004-10

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 213942
ISI: 000224589200005

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Title: Surface and Interface Analysis

Alternative Title : Surf. Interface Anal.

Source Genre: Journal

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Pages: - Volume / Issue: 36 (10) Sequence Number: - Start / End Page: 1392 - 1401 Identifier: ISSN: 0142-2421