Dedicated Max Planck beamline for the in-situ investigation of interfaces and 
thin films

Stierle, A.; Steinhäuser, A.; Rühm, A.; Renner, F.U.; Weigel, R.; Kasper, N.; Dosch, H.

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Dedicated Max Planck beamline for the in-situ investigation of interfaces and thin films

Stierle, A., Steinhäuser, A., Rühm, A., Renner, F., Weigel, R., Kasper, N., et al. (2004). Dedicated Max Planck beamline for the in-situ investigation of interfaces and thin films. Review of Scientific Instruments, 75(12), 5302-5307.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2889-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-288A-F

Genre: Journal Article

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Creators:
Stierle, A.¹, Author
Steinhäuser, A.², Author
Rühm, A.², Author
Renner, F.U.², Author
Weigel, R.¹, Author
Kasper, N.², Author
Dosch, H.^{2, 3}, Author

Affiliations:
1Former Central Scientific Facility ANKA Synchroton Beamline, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497651
2Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497645
3Universität Stuttgart, Institut für Theoretische und Angewandte Physik, ou_persistent22

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Free keywords: MPI für Metallforschung; Abt. Dosch; ZWE MF-ANKA-Beamline;

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Language(s): eng - English

Dates: Date issued: 2004-11-17

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 210819

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Title: Review of Scientific Instruments

Source Genre: Journal

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Pages: - Volume / Issue: 75 (12) Sequence Number: - Start / End Page: 5302 - 5307 Identifier: -