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  Auger Electron Spectroscopical Investigation of Interfacial Segregation in the Cu-Bi System

López, G. A., & Mittemeijer, E. J. (2005). Auger Electron Spectroscopical Investigation of Interfacial Segregation in the Cu-Bi System. In M. Danielewski, R. Filipek, R. Kozubski, W. Kucza, P. Zieba, & Z. Zurek (Eds.), Proceedings of DIMAT 2004, (pp. 1141-1146). Zuerich-Uetikon: Trans Tech Publications Ltd.

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 Creators:
López, G. A.1, Author           
Mittemeijer, E. J.1, 2, Author           
Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644              
2Universität Stuttgart, Institut für Materialwissenschaft, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer;
 Abstract: -

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Language(s): eng - English
 Dates: 2005
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 238141
 Degree: -

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Title: DIMAT 2004. 6th International Conference on Diffusion in Materials
Place of Event: Cracow [Poland]
Start-/End Date: 2004-07-18 - 2004-07-23

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Title: Proceedings of DIMAT 2004,,
Source Genre: Proceedings
 Creator(s):
Danielewski, M, Editor
Filipek, R., Editor
Kozubski, R., Editor
Kucza, W., Editor
Zieba, P., Editor
Zurek, Z., Editor
Affiliations:
-
Publ. Info: Zuerich-Uetikon : Trans Tech Publications Ltd
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 1141 - 1146 Identifier: -

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Title: Defect and Diffusion Forum
Source Genre: Series
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Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 237-240 Sequence Number: - Start / End Page: - Identifier: -