Experimental evidence of the dominant role of low-angle grain boundaries for 
the critical current density in epitaxially grown YBCO thin films

Brück, S.; Albrecht, J.

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Experimental evidence of the dominant role of low-angle grain boundaries for the critical current density in epitaxially grown YBCO thin films

Brück, S., & Albrecht, J. (2005). Experimental evidence of the dominant role of low-angle grain boundaries for the critical current density in epitaxially grown YBCO thin films. Physical Review B, 71: 174508.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-269E-6 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-269F-4

Genre: Journal Article

Alternative Title : Phys. Rev. B

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Creators:
Brück, S.¹, Author
Albrecht, J.¹, Author

Affiliations:
1Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497648

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Free keywords: MPI für Metallforschung; MPI für Festkörperforschung; Abt. Schütz;

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Dates: Date issued: 2005-05-24

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 237013

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Title: Physical Review B

Alternative Title : Phys. Rev. B

Source Genre: Journal

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Pages: - Volume / Issue: 71 Sequence Number: 174508 Start / End Page: - Identifier: -