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  Local density profiles in thin films and multilayers from diffuse x-ray and neutron scattering

Rauscher, M., Reichert, H., Engemann, S., & Dosch, H. (2005). Local density profiles in thin films and multilayers from diffuse x-ray and neutron scattering. Physical Review B, 72(20): 205401. doi:10.1103/PhysRevB.72.205401.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-264E-9 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-264F-7
Genre: Journal Article
Alternative Title : Phys. Rev. B

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 Creators:
Rauscher, M.1, Author           
Reichert, H.2, Author           
Engemann, S.2, Author           
Dosch, H.2, 3, Author           
Affiliations:
1Dept. Theory of Inhomogeneous Condensed Matter, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497643              
2Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497645              
3Universität Stuttgart, Institut für Theoretische und Angewandte Physik, ou_persistent22              

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Free keywords: MPI für Metallforschung; MPI für Metallforschung; Abt. Dietrich; Abt. Dosch/Rühle; Wetting and Capillarity;
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Language(s): eng - English
 Dates: 2005-11-01
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 246330
URI: http://link.aps.org/abstract/PRB/v72/e205401
DOI: 10.1103/PhysRevB.72.205401
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Title: Physical Review B
  Alternative Title : Phys. Rev. B
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 72 (20) Sequence Number: 205401 Start / End Page: - Identifier: -