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Zusammenfassung:
The interface between a crystalline and a vitreous phase of a thin metal supported silica film was studied by low temperature scanning tunneling microscopy. The locally resolved evolution of Si-Si nearest neighbor distances and characteristic angles was evaluated across the border. Furthermore, we investigated the behavior of the ring size distribution close to the crystalline-vitreous transition. The crystalline order was found to decay gradually within about 1.6 nm into the vitreous state.
