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  Complementary metal-oxide-semiconductor-compatible and self-aligned catalyst formation for carbon nanotube synthesis and interconnect fabrication

Zhang, C., Yan, F., Bayer, B. C., Blume, R., Van der Veen, M. H., Xie, R., et al. (2012). Complementary metal-oxide-semiconductor-compatible and self-aligned catalyst formation for carbon nanotube synthesis and interconnect fabrication. Journal of Applied Physics, 111(6): 064310. doi:10.1063/1.3694678.

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 Creators:
Zhang, Can1, Author
Yan, Feng1, Author
Bayer, Bernhard C.1, Author
Blume, Raoul2, Author           
Van der Veen, Marleene H.3, Author
Xie, Rongsi1, Author
Zhong, Guofang1, Author
Chen, Bingan1, Author
Knop-Gericke, Axel2, Author           
Schlögl, Robert2, Author           
Capraro, Bernard D.4, Author
Hofmann, Stephan1, Author
Robertson, John1, Author
Affiliations:
1Department of Engineering, University of Cambridge, Cambridge CB2 1PZ, United Kingdom, ou_persistent22              
2Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              
3imec, Kapeldreef 75, B-3001, Leuven, Belgium, ou_persistent22              
4Intel Ireland Limited, Collinstown Industrial Park, Leixlip, Ireland, ou_persistent22              

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Free keywords: carbon nanotubes; catalysts; elemental semiconductors; interconnections; nanofabrication; nanoparticles; ohmic contacts; self-assembly; sputter etching
 Abstract: We have for the first time developed a self-aligned metal catalyst formation process using fully CMOS (complementary metal-oxide-semiconductor) compatible materials and techniques, for the synthesis of aligned carbon nanotubes (CNTs). By employing an electrically conductive cobalt disilicide (CoSi2) layer as the starting material, a reactive ion etch (RIE) treatment and a hydrogen reduction step are used to transform the CoSi2 surface into cobalt (Co) nanoparticles that are active to catalyze aligned CNT growth. Ohmic contacts between the conductive substrate and the CNTs are obtained. The process developed in this study can be applied to form metal nanoparticles in regions that cannot be patterned using conventional catalyst deposition methods, for example at the bottom of deep holes or on vertical surfaces. This catalyst formation method is crucially important for the fabrication of vertical and horizontal interconnect devices based on CNTs.

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 Dates: 2012-03-212012
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1063/1.3694678
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Title: Journal of Applied Physics
Source Genre: Journal
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Pages: 6 Volume / Issue: 111 (6) Sequence Number: 064310 Start / End Page: - Identifier: -