Frequency Comparison of I2 Stabilized Lasers at 532 nm and Absolute Frequency 
Measurement of I2 Absorption Lines

Nevsky, Alexander Y.; Holzwarth, Ronald; Zimmermann, Marcus; Udem, Thomas; Hänsch, T. W.; von Zanthier, Joachim; Walther, Herbert; Pokasov, Pavel V.; Skvortsov, M. N.; Bagayev, S. N.; Schnatz, H.; Riehle, F.

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Frequency Comparison of I₂ Stabilized Lasers at 532 nm and Absolute Frequency Measurement of I₂ Absorption Lines

Nevsky, A. Y., Holzwarth, R., Zimmermann, M., Udem, T., Hänsch, T. W., von Zanthier, J., et al. (2002). Frequency Comparison of I₂ Stabilized Lasers at 532 nm and Absolute Frequency Measurement of I₂ Absorption Lines. In P. Gill (Ed.), Proceedings of the 6th Symposium on Frequency Standards and Metrology (pp. 521-523). New Jersey: World Scientific.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-C28D-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0018-D004-A

Genre: Conference Paper

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Creators:
Nevsky, Alexander Y.¹, Author
Holzwarth, Ronald², Author
Zimmermann, Marcus², Author
Udem, Thomas², Author
Hänsch, T. W.², Author
von Zanthier, Joachim¹, Author
Walther, Herbert¹, Author
Pokasov, Pavel V.², Author
Skvortsov, M. N., Author
Bagayev, S. N., Author
Schnatz, H., Author
Riehle, F., Author

Affiliations:
1Laser Physics, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445566
2Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445568

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Language(s): eng - English

Dates: Date issued: 2002

Publication Status: Issued

Pages: -

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Table of Contents: -

Rev. Type: Peer

Identifiers: eDoc: 15730

Degree: -

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Title: 6th Symposium on Frequency Standards and Metrology

Place of Event: St. Andrews Univ., Fife, Scotland

Start-/End Date: 2001-09-09 - 2001-09-14

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Title: Proceedings of the 6th Symposium on Frequency Standards and Metrology

Source Genre: Proceedings

Creator(s):
Gill, P., Editor

Affiliations:
-

Publ. Info: New Jersey : World Scientific

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 521 - 523 Identifier: -