Extending optical fs metrology to XUV attosecond pulses

Tzallas, Paraskevas; Witte, Klaus; Tsakiris, George D.; Papadogiannis, N. A.; Charalambidis, D.

doi:10.1007/s00339-004-2680-4

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Extending optical fs metrology to XUV attosecond pulses

Tzallas, P., Witte, K., Tsakiris, G. D., Papadogiannis, N. A., & Charalambidis, D. (2004). Extending optical fs metrology to XUV attosecond pulses. Applied Physics A-Materials Science & Processing, 79(7), 1673-1677. doi:10.1007/s00339-004-2680-4.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-BDC1-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-BDC2-2

Genre: Journal Article

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Creators:
Tzallas, Paraskevas¹, Author
Witte, Klaus^{1, 2}, Author
Tsakiris, George D.^{1, 2}, Author
Papadogiannis, N. A., Author
Charalambidis, D., Author

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1Laser Plasma Physics, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445567
2Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445564

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Language(s): eng - English

Dates: Date issued: 2004-11

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 211534
ISI: 000223464000010
URI: http://www.springerlink.com/link.asp?id=7cd39y7u8d53vx50
DOI: 10.1007/s00339-004-2680-4
Other: 2898

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Title: Applied Physics A-Materials Science & Processing

Alternative Title : Appl. Phys. A-Mater. Sci. Process.

Source Genre: Journal

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Pages: - Volume / Issue: 79 (7) Sequence Number: - Start / End Page: 1673 - 1677 Identifier: ISSN: 0947-8396