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  Fundamental Physics and Precision Measurements

Hänsch, T. W. (2006). Fundamental Physics and Precision Measurements. In C. Roos, H. Häffner, & R. Blatt (Eds.), ATOMIC PHYSICS 20: XX International Conference on Atomic Physics - ICAP 2006 (pp. 79-79). Melville: AIP.

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3315.pdf (Publisher version), 43KB
 
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 Creators:
Hänsch, T. W.1, Author           
Affiliations:
1Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445568              

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Language(s): eng - English
 Dates: 2006
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 294362
URI: http://proceedings.aip.org/proceedings/confproceed/869.jsp
Other: 3315
 Degree: -

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Title: XX International Conference on Atomic Physics - ICAP 2006
Place of Event: Innsbruck
Start-/End Date: 2006-07-16 - 2006-07-21

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Title: ATOMIC PHYSICS 20: XX International Conference on Atomic Physics - ICAP 2006
Source Genre: Proceedings
 Creator(s):
Roos, C., Editor
Häffner, H., Editor
Blatt, R., Editor
Affiliations:
-
Publ. Info: Melville : AIP
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 79 - 79 Identifier: ISBN: 978-0-7354-0367-3

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Title: AIP Conference Proceedings
Source Genre: Series
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Publ. Info: -
Pages: - Volume / Issue: 869 Sequence Number: - Start / End Page: - Identifier: -