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  Absolute frequency measurement and high resolution spectroscopy of 115In+ 5s2 1S0-5s5p 3P0 narrowline transition

Wang, Y. H., Dumke, R., Liu, T., Stejskal, A., Zhao, Y. N., Zhang, J., et al. (2007). Absolute frequency measurement and high resolution spectroscopy of 115In+ 5s2 1S0-5s5p 3P0 narrowline transition. Optics Communications, 273(2), 526-531. doi:10.1016/j.optcom.2007.01.068.

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3384.pdf (Publisher version), 775KB
 
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 Creators:
Wang, Y. H., Author
Dumke, R.1, Author           
Liu, T., Author
Stejskal, A.1, Author           
Zhao, Y. N., Author
Zhang, J., Author
Lu, Z. H.1, Author           
Wang, L. J., Author
Becker, Thomas1, 2, Author           
Walther, Herbert1, Author           
Affiliations:
1Laser Physics, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445566              
2Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445568              

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Free keywords: ion trapping; absolute frequency measurement; high resolution spectroscopy; optical frequency standard
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Language(s): eng - English
 Dates: 2007-05-15
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 316742
ISI: 000245847800036
DOI: 10.1016/j.optcom.2007.01.068
Other: 3384
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Title: Optics Communications
  Alternative Title : Opt. Commun.
Source Genre: Journal
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Pages: - Volume / Issue: 273 (2) Sequence Number: - Start / End Page: 526 - 531 Identifier: ISSN: 0030-4018