Development of a Soft-X-Ray Spectrometer for the Characterization of a 
Laser-driven Undulator Source

Zeitler, Benno

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Development of a Soft-X-Ray Spectrometer for the Characterization of a Laser-driven Undulator Source

Zeitler, B. (2010). Development of a Soft-X-Ray Spectrometer for the Characterization of a Laser-driven Undulator Source. Diploma Thesis, LMU, München.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-B068-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-B069-0

Genre: Thesis

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Creators:
Zeitler, Benno¹, Author

Affiliations:
1Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445564

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Language(s): eng - English

Dates: Accepted: 2010-06-01

Publication Status: Accepted / In Press

Pages: -

Publishing info: München : LMU

Table of Contents: -

Rev. Type: -

Identifiers: eDoc: 478407

Degree: Diploma

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