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  How are Heteroelements (Ga and Ge) Incorporated in Silicate Oligomers?

Schaack, B. B., Schrader, W., & Schüth, F. (2009). How are Heteroelements (Ga and Ge) Incorporated in Silicate Oligomers? Chemistry-A European Journal, 15, 5920-5925. doi:10.1002/chem.200900472.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-8F27-7 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-001A-182C-D
Genre: Journal Article

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 Creators:
Schaack, B. B.1, Author           
Schrader, W.2, Author           
Schüth, F.1, Author           
Affiliations:
1Research Department Schüth, Max-Planck-Institut für Kohlenforschung, Max Planck Society, ou_1445589              
2Service Department Schrader (MS), Max-Planck-Institut für Kohlenforschung, Max Planck Society, ou_1445629              

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Free keywords: electrospray ionization; mass spectrometry; nucleation; silicates; zeolites
 Abstract: -

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Language(s): eng - English
 Dates: 2009
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 460828
DOI: 10.1002/chem.200900472
ISI: 000267278900009
 Degree: -

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Title: Chemistry-A European Journal
  Alternative Title : Chem.-Eur. J.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 15 Sequence Number: - Start / End Page: 5920 - 5925 Identifier: ISSN: 0947-6539